Tuesday 16 September 2014

JAMB test Goes Computer Based



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The Unified Tertiary Matriculation Examination (UTME) of the Joint Admissions and Matriculations Board (JAMB) will from next year go full-blown computer based test.

Registrar and Chief Executive of the board, Professor Dibu Ojerinde disclosed this at the second technical committee meeting for 2014/2015 admissions into tertiary intuitions in the country

Ojerinde stated that last year UTME was partially manual and computer based test but noted that with the success recorded last year, the board would go full blown on computer based test in 2015/2016 UTME.

Ojerinde disclosed that anybody who can operate handsets will be able to take part in the computer based tests.

He therefore appealed to the Governor to build and operate computer centres,  one at least in each of

the three senatorial districts of the state for the candidates from the state because  the board has only four computer based centres in the state.

Niger State governor, Dr. Muazu Babangida Aliyu in his speech at the occasion charged JAMB to sanitize the nation’s examination system for a better integrity of the certificate of the nation’s tertiary institutions.

Aliyu who spoke through his Commissioner of Education, Mallam Abdulhameed Danladi Umar at the College of Education, Minna venue of the meeting noted that JAMB must introduce measures aimed at curbing examination malpractices.

According to him, the Board under Professor Ojerinde has been able to improve the process of examination administration and the overall development of the educational sector,

“Let me reiterate that our administration will continue to support JAMB in its determination to sanitize the nation’s examination system so as to enhance the integrity of our certificates.

“There has been a deliberate policy to pay WAEC and NECO examination fees for every student in the state irrespective of their state of origin”, Aliyu said, adding that N700 million has been approved for the payment of the fees for 2014/2015 examination year.

 

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